Scanning Electron Microscopy (SEM) offers high-resolution imaging that reveals surface details invisible to traditional optical microscopy. It is critical for analyzing fractures, contaminants, and microstructural features of biomedical devices. Invision Biomedical uses SEM to provide insights that strengthen quality control, support R&D, and streamline regulatory submissions.
SEM provides detailed magnification of surfaces with resolution up to 3.0nm. This helps identify microfractures and surface irregularities that impact performance.
Even trace particles and residues can be visualized and assessed. This ensures devices meet cleanliness and quality requirements.
SEM reveals fracture origins, wear, and corrosion at micro levels. This data supports corrective actions in design or manufacturing.
Analyze wet, oily, or non-conductive samples in their natural state without conventional sample preparation.
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Non-conductive samples are typically coated with a thin layer of metal and mounted on conductive stubs to allow electron beam imaging. Proper preparation ensures clarity and reproducibility.
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The sample surface is scanned with a focused electron beam, generating high-resolution images. This process reveals nanoscale details invisible to the eye.
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Defects, contaminants, and structural details are analyzed and documented. This step provides actionable insights for quality assurance or redesign.
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Findings are compiled into detailed reports with images, annotations, and compliance-ready documentation.
SEM is widely applied across biomedical device research and quality control. It supports:
SEM uses electron beams instead of light, allowing magnification at the nanometer scale. This provides much higher resolution and depth of field, making it ideal for biomedical device surfaces.
Yes, SEM can visualize particles, residues, and fibers that are invisible to the naked eye. This makes it especially useful for contamination investigations in cleanroom manufacturing.
SEM is non-destructive for samples that are conductive. Non-conductive samples need to be coated with a thin layer of conductive material to be analyzed in the SEM. The same sample can often undergo complementary analyses afterward.
Yes, SEM is commonly included in failure analysis and contamination studies that are submitted to regulators. It provides visual evidence that supports device safety.
Partner with Invision Biomedical for high-resolution imaging that supports innovation and compliance.
